IP1X–IP4X Probe Selector & Kit Guide

IP1X–IP4X Probe Selector & Kit Guide

IP1X–IP4X Probe Selector & Kit Guide

The HNT-PTKIT set gathers the calibrated probes that IEC 60529, IEC 61032 and UL 61032 call for into one aluminium suitcase, so a lab can move from a 50 mm sphere check on IP1X to a 1.0 mm wire check on IP4X without re-kitting the bench between tests. Engineers shortlisting test probe kits usually need four things at once: the right tip geometry, the correct thrust band, a way to measure applied force, and a case that survives transport. That is why this kit pairs Probe A, the jointed test finger B, the 2.5 mm rod C and the 1.0 mm wire D with an integrated thrust dynamometer and labelled storage. If your test plan covers only one ingress level, the enquiry form on the same page is where you describe the single IEC 60529 test probe kit configuration you want quoted.

IP1X – IP4XFour solid-foreign-object grades in one kit
4 Calibrated ProbesPAT · PBT · PCT · PDT
10–50 N / 3 N / 1 NSpecified thrust bands by probe
IEC/EN 60529 Test Probe Kits With Thrust Dynamometer For ip1x ip2x ip3x ip4x probes

HNT-PTKIT: IEC/EN 60529 test probe kit with thrust dynamometer for IP1X, IP2X, IP3X and IP4X probes.

IP Code to Probe Decision Matrix

Match the IP level written in your test plan to the probe that carries the defined geometry and thrust band. The values below are the dimensional parameters listed for HNT-PTKIT.

IP Level Probe Tip Geometry Baffle Plate / Dam-Sphere Handle Thrust
IP1X Test Sphere Probe A (HNT-PAT) Sphere, 50 mm diameter Baffle plate Ø45 mm × 4 mm thick Ø10 mm × 100 mm 10–50 N
IP2X Jointed Finger Probe B (HNT-PBT) Knurled finger Ø12 mm × 80 mm Baffle plate Ø50 mm, 100 mm length Ø10 mm class handle with banana jack 10–50 N
IP3X Test Probe C (HNT-PCT) Rod Ø2.5 mm × 100 mm length Dam-sphere Ø35 mm Ø10 mm × 100 mm 3 N
IP4X Test Probe D (HNT-PDT) Wire Ø1.0 mm × 100 mm length Dam-sphere Ø35 mm Ø10 mm × 100 mm 1 N
Buyer decision Read the matrix by row, not by tip size alone. The 10–50 N band applies to the IP1X sphere and the IP2X finger, while the IP3X rod and IP4X wire are specified at 3 N and 1 N. Choose the row that matches the code on your test report, then confirm the handle and baffle dimensions against the drawing you are working from.

Kit Configuration & What Ships In The Case

HNT-PTKIT is supplied as a complete four-probe set rather than a loose assortment of parts. This is what the product page lists inside the case.

HNT-PTKIT contents: four IEC 60529 probes, thrust dynamometer, aluminum suitcase

HNT-PTKIT contents: four IEC 60529 probes, thrust dynamometer and outdoor aluminium suitcase.

  • HNT-PAT — Test Sphere Probe A50 mm sphere with handle, specified thrust 10–50 N. Covers the IP1X row.
  • HNT-PBT — Jointed Finger Probe BKnurled finger Ø12 × 80 mm with banana jack in the handle, specified thrust 10–50 N. Covers the IP2X row.
  • HNT-PCT — 2.5 mm Test Rod C100 mm rod with Ø35 mm dam-sphere and Ø10 × 100 mm handle, specified thrust 3 N. Covers the IP3X row.
  • HNT-PDT — 1.0 mm Test Wire D100 mm wire with Ø35 mm dam-sphere and Ø10 × 100 mm handle, specified thrust 1 N. Covers the IP4X row.
  • Integrated Thrust DynamometerForce measurement for the thrust you apply during an accessibility test.
  • Aluminium SuitcaseRobust case for transportation and organised storage of the full probe set.
Buyer decision If your scope is enclosure accessibility testing across several product lines, the single-case configuration removes the risk of a bench missing one probe mid-programme. If your scope is narrower, describe the probe coverage you need in a quote request so the team can confirm what can be supplied.

Thrust Force & Why Calibration Decides The Result

A test only means something if the force behind the probe matches the code it claims to verify. HNT-PTKIT probes are precision-engineered products calibrated for specific thrust force ranges, with an integrated dynamometer for force measurement.

IP1X sphere (Probe A) & IP2X finger (Probe B)10–50 N
IP3X rod (Probe C)3 N
IP4X wire (Probe D)1 N

Bars indicate the relative size of each specified thrust band; they are not a linear force scale.

Force is part of the specification The 10–50 N band for the sphere and jointed finger sits far above the 3 N rod and 1 N wire values. Applying the wrong force invalidates a comparison between test runs.
Measure, do not assume The integrated thrust dynamometer lets technicians record the force actually applied instead of relying on an operator’s feel.
Calibrated probes, repeatable conditions Calibrated probes and calibrated force limits support reproducible testing conditions across product development, manufacturing quality control and certification testing.

Standards Fit: IEC 61032, IEC 60529 And UL

The kit is designed to provide the probes required by UL / IEC / EN 61032 and the IP Code standard, so one purchase supports the accessibility testing sequence from IP1X through IP4X.

Enclosure access

Protecting people from hazardous parts

The probe set is used to verify that protective enclosures prevent user access to hazardous parts. Probe A, finger B, rod C and wire D each test a different access path on the same housing.

Buyer decision
Check whether your hazard-based requirement is written against the jointed finger, the sphere, or both before you fix the probe list for a quote.
Foreign objects

Preventing ingress of foreign objects

The same kit addresses solid foreign-object ingress, which is where the 2.5 mm rod and 1.0 mm wire definitions matter most.

Buyer decision
If your product is rated IP3X or IP4X, confirm that the rod and wire are the probes your mark requires — they are both included in HNT-PTKIT.
Standards reference

UL, IEC and EN 61032 alignment

The kit is stated to meet requirements for testing standard(s) including but not limited to IEC 61032, with defined dimensional parameters aligned to IEC 61032 and IEC 60529.

Buyer decision
Keep a copy of the drawing set your notified body or customer cites, then cross-check each diameter, length, baffle and dam-sphere figure against the matrix above.

Scenario To Specification: Pick The Kit By Where You Test

Four common situations, each tied to a concrete fact in the kit specification and a decision you can act on.

Design & development

Iterating a new enclosure opening

Early prototypes often change vent slots, seams and connector apertures from one build to the next. You need IP1X sphere and IP2X finger checks on the same day you test the IP3X and IP4X slots.

Specification anchor
50 mm sphere (Ø45 × 4 mm baffle) at 10–50 N, plus jointed finger B at 10–50 N.
Buyer decision
Order the four-probe kit rather than buying probes one at a time, so a geometry change never stops a build review.
Production quality control

Sampling enclosures on a line

Line-side checks need a repeatable force and a probe that goes back to the same place after every shift. Loose probes disappear or get mixed up.

Specification anchor
Aluminium suitcase for transportation and organised storage, plus the integrated thrust dynamometer for force measurement.
Buyer decision
Standardise the station on one cased kit so every operator applies the same recorded thrust on every sample.
Certification preparation

Building a defensible test file

Third-party reviewers ask how the access test was performed, with which probe and at what force.

Specification anchor
Calibrated probes with calibrated force limits: 10–50 N, 3 N and 1 N across IP1X–IP4X.
Buyer decision
Record the probe used and the measured thrust for each test point so the report matches the dimensional parameters you tested against.
External & field testing

Testing at a customer site

Site visits mean probes travel by vehicle and are handled by people who did not pack them.

Specification anchor
Robust aluminium case storing the sphere, jointed finger, rod and wire together with the dynamometer.
Buyer decision
Choose the cased kit over individual probes when the same set has to leave the lab and return intact.

Request A Quote For HNT-PTKIT

Tell the team your IP range, the probes you need covered and the quantity of kits required. They will come back with the latest quote for the IEC/EN 60529 test probe kit configuration that matches your test plan.

Related Reading

Three notes to help clarify product requirements before contacting the supplier.

How to Choose an IP Protection Test Probe Kit for Enclosure Testing

Choosing an IP protection test probe kit starts with the enclosure opening and the target IP level rather than with the order in which probes appear in a catalog.

Read article

IP1X Solid Foreign Object Protection and the 50 mm Sphere Probe

IP1X is the first level of solid-object protection in IEC 60529, and the 50 mm sphere probe is the tool that verifies it.

Read article

Jointed Test Finger Probe B Geometry in Enclosure Opening Tests

Probe B's 12 mm jointed finger, 80 mm reach, and 50 mm baffle decide which enclosure openings count as accessible.

Read article

Frequently Asked Questions

which ip protection levels does the hnt-ptkit cover?

the kit covers ip1x through ip4x. it contains the 50 mm sphere probe a for ip1x, the jointed test finger b for ip2x, the 2.5 mm rod probe c for ip3x and the 1.0 mm wire probe d for ip4x, together with an aluminium suitcase.

what thrust force applies to each probe?

the ip1x sphere and the ip2x jointed finger are specified with a 10–50 n thrust. the ip3x 2.5 mm rod is specified at 3 n and the ip4x 1.0 mm wire at 1 n. the integrated thrust dynamometer is provided for force measurement during testing.

what is included in the hnt-ptkit kit?

the kit contains the hnt-pat test sphere probe with 10–50 n thrust, the hnt-pbt jointed finger probe with 10–50 n thrust and a banana jack in the handle, the hnt-pct 2.5 mm test rod with 3 n thrust, the hnt-pdt 1.0 mm test wire with 1 n thrust, an integrated thrust dynamometer and an aluminium suitcase.

which standards does the kit align with?

the kit is designed to provide the probes required by ul, iec and en 61032 and the ip code standard, and its defined dimensional parameters align with iec 61032 and iec 60529. it supports accessibility testing from ip1x through ip4x.

can i request a single probe instead of the full kit?

the product page presents hnt-ptkit as a complete four-probe kit in an aluminium case. if your test plan covers fewer ingress levels, describe the configuration you need in the request a quote form so the team can confirm what can be supplied.

where is this probe kit typically used?

the product page lists product development, manufacturing quality control and certification testing, where the aim is to prevent user access to hazardous parts or the ingress of foreign objects.